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The Proceq Equotip Leeb D 540 model is a pragmatic, cost-effective, alternative to the Equotip Leeb D 550. Test blocks are available to purchase seperately - see related acceories below or click here.
The Proceq Equotip Leeb D 540 hardness tester is versatile and capable of on-site testing of heavy, large or installed parts. Works with the full Leeb probe portfolio and can be combined with Portable Rockwell and UCI.
The Proceq Equotip 540 Leeb D hardness tester is rated as highly accurate and offers a field-tested, rugged touchscreen designed for an excellent user experience for measuring and analysis. The unit comes with enhanced software features, analysis functions, ready-to-go reports with powerful built-in reporting features.
There is also an option to upgrade the Proceq Equotip Leeb D 540 model to the Equotip 550 Leeb D model if desired so you can take advantage of features such as customizable PDF reports, data export via Equotip Link, connecting additional probes, automatic compensation for impact direction and more. Contact a Berg sales engineer at 847-577-3980 or email info@bergeng.com if you are interested in upgrading or purchasing an extended warranty.
Equotip 540 Leeb D takes advantage of a new generation full color, dual processor Touchscreen Unit with enhanced software capabilities. The instrument offers a unique range of functions which ultimately help speed up on-site and laboratory inspections and analysis.
|
Software |
Software Qualities | Equotip 540 | Equotip 550 |
| Best-in-class measuring performance in accordance to international standards | Yes | Yes | |
| Wide array of data saving and exploring features on unit | Yes | Yes | |
| Intuitive touchscreen navigation and personalized views | Yes | Yes | |
| Quick shift conversions (UCI) | Yes | Yes | |
| Default PDF reports | Yes | Yes | |
| Customizable PDF reports | Upgrade to 550 | Yes | |
| Data export to PC via Equotip Link | Upgrade to 550 | Yes | |
| Connect additional probes | Upgrade to 550 | Yes | |
| Automatic compensation for impact direction (Leeb D) | Upgrade to 550 | Yes | |
| Custom conversion curves | Upgrade to 550 | Yes | |
| Interactive wizards | Upgrade to 550 | Yes | |
| Password protection for device lock | Upgrade to 550 | Yes | |
| Multi-language support | Yes | Yes |
|
Hardware |
Hardware Qualities | Equotip 540 | Equotip 550 |
| Powerful touchscreen with rugged housing | Yes | Yes | |
| Equotip Leeb D resp. UCI HV1-10 probe with cables | Yes | Yes | |
| Rugged carrying case | Yes | Yes | |
| Compatible with other Equotip probes | Upgrade to 550 | Yes | |
| Test block | Upgrade to 550 | Yes | |
| Surface roughness comparator plate | Upgrade to 550 | Yes | |
| Coupling paste | Upgrade to 550 | Yes |
|
Native Scale |
HL |
|
Measuring Range |
150 - 950 HL |
|
Measuring Accuracy |
± 4 HL (0.5% at 800 HL) |
|
Available Scales |
HB, HV, HRA, HRB, HRC, HS, MPA |
|
Available Probes |
Leeb D / DC / DL / S / E / G / |
|
Combination With Other Methods |
Portable Rockwell, UCI (Only available with the 550 upgrade) |
|
Average Roughness Ra (µm / µinch) |
7 / 275 (Leeb G) |
|
Minimum Mass (kg / lbs) |
0.02 / 0.045 (Leeb C) |
|
Minimum Thickness (mm / inch) |
1 / 0.04 (Leeb C) |
Standards & Guidelines
|
Standards ASTM A 956 |
Guidelines ASME CRTD-91 |
|
Display |
7” color display 800x480 pixels |
|
Memory |
Internal 8 GB flash memory |
|
Regional Settings |
Metric and Imperial units, multi-language and timezone supported |
|
Power Input |
12 V +/-25 % / 1.5 A |
|
Connectors |
Probe, USB host / device and Ethernet |
|
Dimensions |
250 x 162 x 62 mm |
|
Weight |
1525 g (incl. Battery) |
|
Battery |
3.6 V, 14.0 Ah |
|
Battery Lifetime |
> 8 h (in standard operating mode) |
|
Humidity |
< 95 % RH, non condensing |
|
Operating Temperature |
-10 °C to +50 °C |
|
IP |
54 |
|
Certification |
CE |
