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The Proceq Leeb G hardness tester is versatile and capable of on-site testing of heavy, large or installed parts. Works with the full Leeb probe portfolio and can be combined with Portable Rockwell and UCI.
The Proceq Leeb G hardness tester is rated as highly accurate and offers a field-tested, rugged touchscreen designed for an excellent user experience for measuring and analysis. The unit comes with enhanced software features, analysis functions, ready-to-go reports with powerful built-in reporting features.
Equotip 550 Leeb G takes advantage of a new generation full color, dual processor Touchscreen Unit with enhanced software capabilities. The instrument offers a unique range of functions which ultimately help speed up on-site and laboratory inspections and analysis.
Features:
|
Instrument Firmware |
Automatic compensation for impact direction |
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PC Software |
Equotip Link allowing direct reporting and custom reports |
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Display |
7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor |
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Memory |
Internal 8 GB flash memory (> 1’000’000 measurements) |
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Connections |
USB host / device and Ethernet |
Additional Features:
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Wide Measurement Range |
Leeb G impact devices are best suited for on-site testing of heavy, large or already installed parts. |
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Broad Hardness Scales Coverage |
The measurements are automatically converted to all common hardness scales (HV, HB, HRC, HRB, HRA, HS) as required. |
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Impact Devices & Accessories |
Proceq offers a wide variety of impact devices along with support rings to serve most hardness testing requirements. |
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Test Blocks Portfolio |
Extensive range of precise hardness test blocks available for each impact device with different hardness levels for regular verification. |
Applications:
|
Standard to large objects |
Yes |
|
Round objects |
In combination with support rings |
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Light objects |
With impact device Leeb C |
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Very hard objects |
With impact devices Leeb S and E |
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Cast objects |
With impact device Leeb G |
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Polished objects |
With impact device Leeb C |
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Limited accessibility |
With impact devices Leeb DC and DL |
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Additional Applications: |
Fire damage assessment |
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Native Scale |
HL |
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Measuring Range |
150 - 950 HL |
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Measuring Accuracy |
± 4 HL (0.5% at 800 HL) |
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Available Scales |
HB, HV, HRA, HRB, HRC, HS, MPA |
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Available Probes |
Leeb D / DC / DL / S / E / G / |
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Combination With Other Methods |
Portable Rockwell, UCI |
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Average Roughness Ra (µm / µinch) |
7 / 275 (Leeb G) |
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Minimum Mass (kg / lbs) |
0.02 / 0.045 (Leeb C) |
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Minimum Thickness (mm / inch) |
1 / 0.04 (Leeb C) |
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Standards ASTM A 956 |
Guidelines ASME CRTD-91 |
|
Display |
7” color display 800x480 pixels |
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Memory |
Internal 8 GB flash memory |
|
Regional Settings |
Metric and Imperial units, multi-language and timezone supported |
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Power Input |
12 V +/-25 % / 1.5 A |
|
Connectors |
Probe, USB host / device and Ethernet |
|
Dimensions |
250 x 162 x 62 mm |
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Weight |
1525 g (incl. Battery) |
|
Battery |
3.6 V, 14.0 Ah |
|
Battery Lifetime |
> 8 h (in standard operating mode) |
|
Humidity |
< 95 % RH, non condensing |
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Operating Temperature |
-10 °C to +50 °C |
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IP |
54 |
|
Certification |
CE |
