Accessories

Parker Research Accessories are designed for use with magnetic particle systems. Parker Research test bars and test rings imitate surface and subsurface defects to ensure that your magnetic particle system is measuring accurately. Pie gages are useful for determining the direction of magnetic fields and finding defects in ferrous metals. Kits are available for Contour Probes with all accessories required for magnetic particle inspection.

For more information about Parker Research Accessories, contact our knowledgeable sales engineers by calling 1-847-577-3980 or emailing info@bergeng.com.